USA/ Austin/ Texas
BTECH/MTECH
Analyze the design.
Top Level Test Pin Planning.
MBIST Insertion, & Optimization.
Scan Insertion, Scan Compression.
Check scan insertion results.
Run formal verification between synthesized netlist and post DFT netlist.
Generate DFT constraints for backend and Primetime.
Provide BE team with post DFT netlist and associated constraints.
Validation plan and test development.
Generate ATPG Test Patterns.
Block level and soc level patten generation.
SOC level pattern re-target.
Monitor test coverage and pattern counts.
Run ATPG and pattern verification on DFT inserted netlist
Block level pattern no timing simulation.
SOC level pattern simulation.
Block level timing simulation.
MBIST pattern RTL and gate level validation.
Run full MBIST, scan pattern generation and verification (both pre and post layout netlist)
After chip top netlist is available, all block MBIST, scan pattern generation and verification should be run from top level.
Firmware and API development.
Hardware/system debug.